Photography and technical data supplied by: BIOBASE · 1 image.
Microscopy
Atomic Force Microscopy
BK-AFM1000
Atomic Force Microscopy(AFM) is a high-resolution imaging technique used for analyzing surface characteristics at the nanometer scale. AFM is widely used in materials science, biology, physics, and nanotechnology for studying surfaces and thin films, allowing researchers to capture topographical maps with atomic precision.
Key features
- Application-specific optical system
- Configurable objectives and illumination
- Digital capture options
- Manufacturer
- BIOBASE
01 / LaboratoriX technical datasheet
LaboratoriX technical datasheet
Technical parameters consolidated from the manufacturer documentation. Each column corresponds to one model; shared values are clearly identified. Final configuration, accessories, power supply and applicable documentation are confirmed with the quotation.
| Parameter | BK-AFM1000 |
|---|---|
| Working Modes | |
| Sample Size | |
| Scanners Available | |
| Scanning Resolution | |
| Range of Sample Movement | |
| Step-motor Pulse Width | |
| Image Sampling Points | |
| Optical Magnification 4X | |
| Scan Rate 0.6Hz~4.34Hz | |
| Scanning Control | |
| Data Sampling | |
| Feedback | |
| Feedback Sampling Rate | |
| Computer interface | |
| Operating System | |
| Supply Power | |
| Package Size | |
| Gross Weight |
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