Microscopy

Atomic Force Microscopy

BK-AFM1000

Atomic Force Microscopy(AFM) is a high-resolution imaging technique used for analyzing surface characteristics at the nanometer scale. AFM is widely used in materials science, biology, physics, and nanotechnology for studying surfaces and thin films, allowing researchers to capture topographical maps with atomic precision.

Key features

  • Application-specific optical system
  • Configurable objectives and illumination
  • Digital capture options
Made to orderPrice on request
Manufacturer
BIOBASE
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01 / LaboratoriX technical datasheet

LaboratoriX technical datasheet

Technical parameters consolidated from the manufacturer documentation. Each column corresponds to one model; shared values are clearly identified. Final configuration, accessories, power supply and applicable documentation are confirmed with the quotation.

ParameterBK-AFM1000
Working Modes
Contact mode and lapping mode Optional modes: Phase, Friction(LFM), Magnetic(MFM), Electrostatic(EFM)
Sample Size
Ф≤90 mm, H≤20 mm
Scanners Available
10 × 10 µm, 20 × 20 µm, 50 × 50 µm, 100 × 100 µm
Scanning Resolution
0.2 nm in XY direction, 0.05 nm in Z direction
Range of Sample Movement
±6.5 mm
Step-motor Pulse Width
10±2ms
Image Sampling Points
512 × 512
Optical Magnification 4X
Optical resolution 2.5 µm
Scan Rate 0.6Hz~4.34Hz
Scan angle 0°~360°
Scanning Control
18-bit D/A in XY direction, 16-bit D/A in Z direction
Data Sampling
14-bit A/D, double 16-bit A/D multi-channel synchronous sampling
Feedback
DSP digital feedback
Feedback Sampling Rate
64 kHz
Computer interface
USB 2.0
Operating System
Windows XP/7/8/10
Supply Power
AC220V, 50/60 Hz; 110 V, 50/60 Hz(optional)
Package Size
550 × 550 × 1150 mm
Gross Weight
65 kg

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